Task Group 102
Detriment Calculation Methodology

A Task Group under Committee 1

Radiation detriment is a concept used to quantify the overall harm to health from stochastic effects of low-level radiation exposure of different parts of the body. The tissue-specific detriment is determined from the nominal tissue-specific risk coefficient, weighted by the severity of the disease in terms of lethality, impact on quality of life and years of life lost. Total detriment is the sum of the detriments for separate tissues and organs. Detriment values are used to specify tissue weighting factors used in the calculation of effective dose.

Calculating radiation detriment is a complex process that requires information from various sources and judgements on how the calculations are best performed. The current methodology is outlined in Annex A of ICRP Publication 103, but it is possible that future interpretation of available data, including the calculation of detriment from cancer incidence data, will apply revised methodology and different judgements in the light of developing evidence and understanding. To form a solid basis for future recommendations, the process of detriment calculation will be reviewed and documented in a reproducible manner, considering ways in which different approaches might be applied when new data become available.

Nobuhiko Ban (Chair), Nuclear Regulation Authority, Japan
Tamara Azizova (Corresponding Member), Southern Urals Biophysics Institute, Russian Federation
Simon Bouffler (Corresponding Member), PHE, UK
Enora Clro (Corresponding Member), French Institute for Radiological Protection and Nuclear Safety (IRSN), France
Donald A. Cool (Corresponding Member), Electric Power Research Institute (EPRI), USA
Nobuyuki Hamada (Corresponding Member), CRIEPI, Japan
John D. Harrison (Corresponding Member), Oxford Brookes University and Public Health England, UK
Dominique Laurier (Member), French Institute for Radiological Protection and Nuclear Safety (IRSN), France
Dale Preston (Corresponding Member), Hirosoft, USA
Ludovic Vaillant (Member), CEPN, France
Wei Zhang (Member), PHE, UK